Materials Characterization, laboratory course D
Aalto University
In this course, the student can exploit the most common materials characterization methods to characterize the structure and physical properties of materials. The student can evaluate the capabilities and limitations of major materials and surface characterization techniques such as: Optical microscopy, Raman, Four Probe Resistivity and Hall Measurement, XRD, AFM, TEM, SEM, EDS, XPS, Auger, SIMS.
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Course dates
24 February 2025 - 02 June 2025
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Lecturer
Girish Tewari
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Place/Venue
School of Chemical Engineering / Department of Chemistry and Materials Science
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City
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Country
Finland
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ECTS
5 points
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Link
https://mycourses.aalto.fi/course/search.php?...
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Language
English
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Block-scheduling
No
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Cost
Not available
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