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Materials Characterization, laboratory course D


Aalto University


In this course, the student can exploit the most common materials characterization methods to characterize the structure and physical properties of materials. The student can evaluate the capabilities and limitations of major materials and surface characterization techniques such as: Optical microscopy, Raman, Four Probe Resistivity and Hall Measurement, XRD, AFM, TEM, SEM, EDS, XPS, Auger, SIMS.


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Course dates
24 February 2025 - 02 June 2025
Lecturer
Girish Tewari
Place/Venue
School of Chemical Engineering / Department of Chemistry and Materials Science
City
Country
Finland
ECTS
5 points
Link
https://mycourses.aalto.fi/course/search.php?...
Language
English
Block-scheduling
No
Cost
Not available